High-resolution linearity measurements of photovoltaic devices using digital light processing projection

Abstract Although photovoltaic (PV) devices are rated at standard testing conditions (STCs), these STCs rarely met, either outdoors, or when PV used for indoor applications. Thus, it is beneficial to fully characterise the linearity of with respect irradiance. Moreover, high accuracy measurements essential reference cells (RCs), as they ensure precision measured This work presents a new technique based on digital light processing (DLP). The proposed system uses micromirror device coupled projection optics and high-power LED array. By creating series patterns projected under test specific number bright dark pixels, can be implemented through spatial dithering process. Since process mechanical, expected that any spectral variability effects different levels electrical non-linearities source avoided. developed provide thousands measurement points curve in seconds, which impossible other currently established methods. Measurements RCs known curves acquired validated by conventional Results demonstrate DLP method provides equal compared systems, but significantly higher resolution (points curve) order magnitude speed.